Methods and apparatus for electrically characterizing...

Details Methods and apparatus for electrically characterizing... Methods and apparatus for electrically characterizing...

2007-01-04

2009-11-17

Patidar, Jay M (Department: 2858)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S691000, C324S719000

Reexamination Certificate

active

07619409

ABSTRACT:
A method of electrically characterizing a magnetic tunnel junction film stack having three metal layers separated by two dielectric layers comprises three steps. In a first step, four or more probes are electrically coupled to a surface of the magnetic tunnel junction film stack. In a second step, electrical resistance is determined with the four or more probes for each of a plurality of spacings between the probes. Finally, in a third step, the plurality of resistance measurements are fitted with one or more equations that relate electrical resistance to probe spacing.

REFERENCES:
patent: 6538430 (2003-03-01), Carrington et al.
patent: 6927569 (2005-08-01), Worledge et al.
patent: 2004/0051522 (2004-03-01), Worledge et al.

Affiliated with

Also associated with

Rating

Methods and apparatus for electrically characterizing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods and apparatus for electrically characterizing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and apparatus for electrically characterizing... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4127617