Probe microscope and measuring method using probe microscope

Details Probe microscope and measuring method using probe microscope Probe microscope and measuring method using probe microscope

2007-05-01

2009-10-27

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

C324S754090, C250S306000, C250S309000, C850S033000, C850S058000

Reexamination Certificate

active

07609048

ABSTRACT:
Provided is a probe microscope for measuring a surface potential of a sample, including a contact electrification mechanism (circuit (C)) for bringing an electroconductive probe device into contact with a surface of the sample and applying a voltage in the contact state to induce electrification on the surface of the sample, and a potential measuring mechanism (circuit (K)) for measuring the surface potential of the sample caused by the contact electrification mechanism in a non-contact state of the electroconductive probe device and the surface of the sample, wherein the electrification induced by the contact electrification mechanism and the measurement of the surface potential by the potential measuring mechanism alternate in time series while the voltage applied during the contact is gradually changed, thereby measuring a correlation between the applied voltage and the surface potential.

REFERENCES:
patent: 7282710 (2007-10-01), Black et al.
patent: 2004/0051542 (2004-03-01), Miles et al.
patent: 2005/0269510 (2005-12-01), Chang
patent: 2007/0018504 (2007-01-01), Wiener et al.
patent: 2007/0024295 (2007-02-01), Humphris et al.
patent: 7-66250 (1995-03-01), None
patent: 2000-28625 (2000-01-01), None
patent: 2000-329680 (2000-11-01), None
C.B. Duke, “Polymers as electronic materials”, J. Vac. Sci. Technol. A 3(3), May/Jun. 1985, pp. 732-738.
T.J. Fabish, et al., “Molecular charge states and contact charge exchange in polymers”, Journal of Applied Physics, vol. 48, No. 10, Oct. 1977, pp. 4256-4266.

Affiliated with

Also associated with

Rating

Probe microscope and measuring method using probe microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe microscope and measuring method using probe microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe microscope and measuring method using probe microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4118779