System and method for transferring trays within a test handler

Details System and method for transferring trays within a test handler System and method for transferring trays within a test handler

2008-02-28

2009-02-24

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07495463

ABSTRACT:
A handler for handling semiconductor chips during a testing process includes a loading position at which packaged chips are loaded into a test tray, and an unloading position at which the packaged chips are unloaded from the test tray. The test tray follows a path through the handler from the loading position to the unloading position, and from the unloading position to the loading position. By separately performing the loading and unloading operations at these different positions within the handler, malfunctions in loading and unloading pickers that load and unload the chips may be reduced. Further, a malfunction in one picker performing one operation may be prevented from influencing operations of the other picker performing another operation. Additionally, collision between the loading picker and the unloading picker may be prevented.

REFERENCES:
patent: 5227717 (1993-07-01), Tsurishima et al.
patent: 6287878 (2001-09-01), Maeng et al.
patent: 100223093 (1999-07-01), None
patent: 100560729 (2006-03-01), None

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