Testing method and apparatus of thin-film magnetic head

Details Testing method and apparatus of thin-film magnetic head Testing method and apparatus of thin-film magnetic head

2007-04-25

2009-06-09

Patidar, Jay M (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

Reexamination Certificate

active

07545139

ABSTRACT:
A testing method of a thin-film magnetic head has an MR read head element with a multi-layered structure including a magnetization-fixed layer, a magnetization-free layer and a nonmagnetic intermediate layer or a tunnel barrier layer sandwiched between the magnetization-fixed layer and the magnetization-free layer. The method includes a step of feeding through the MR read head element a sense current, a step of measuring non-signal output versus frequency characteristics of the MR read head element over a frequency range that covers at least FMR of the magnetization-fixed layer, and a step of discriminating whether the thin-film magnetic head is a head providing high-temperature noises by comparing a frequency of a peak of the non-signal output resulting from FMR of the magnetization-fixed layer with a threshold.

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