System and method for testing power transistors

Details System and method for testing power transistors System and method for testing power transistors

2008-02-28

2009-02-03

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S762010

Reexamination Certificate

active

07486099

ABSTRACT:
A method for testing a power converter having at least one power transistor is disclosed. The method may include receiving a power transistor test request, and resetting a fault flag for each power transistor, wherein the fault flag indicates a fault status associated with a corresponding power transistor. The method may also include applying a gate driver signal to each power transistor, receiving a feedback signal from each power transistor, and determining a difference between the gate driver signal and the feedback signal associated with a respective power transistor. The method may further include identifying a power transistor fault if the difference exceeds a threshold profile, and setting the fault flag for the power transistor on which a power transistor fault is identified.

REFERENCES:
patent: 4896242 (1990-01-01), Neft
patent: 5481194 (1996-01-01), Schantz et al.
patent: 5978195 (1999-11-01), Goder et al.
patent: 6097582 (2000-08-01), John et al.
patent: 6145107 (2000-11-01), Farokhzad
patent: 6724313 (2004-04-01), Sato et al.
patent: 6836125 (2004-12-01), Breit et al.
patent: 6900997 (2005-05-01), Perreault et al.
patent: 6927988 (2005-08-01), Cheng et al.
patent: 7219022 (2007-05-01), Wekhande
patent: 2004/0095787 (2004-05-01), Donaldson et al.

Affiliated with

Also associated with

Rating

System and method for testing power transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for testing power transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for testing power transistors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4110662