Method of testing an electronic circuit and apparatus thereof

Details Method of testing an electronic circuit and apparatus thereof Method of testing an electronic circuit and apparatus thereof

2007-11-05

2009-11-24

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S109000, C702S189000, C324S501000, C324S754120, C324S765010, C703S014000

Reexamination Certificate

active

07623982

ABSTRACT:
A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated. The method further comprises accumulating the plurality of samples to generate a value, and generating a test result based on the value.

REFERENCES:
patent: 4706018 (1987-11-01), Beha et al.
patent: 6819125 (2004-11-01), Green et al.
patent: 6897664 (2005-05-01), Bruce et al.
patent: 7019311 (2006-03-01), Horn
patent: 7206078 (2007-04-01), Pfaff et al.
patent: 2008/0238435 (2008-10-01), Bockelman et al.
Fritz et al., ‘A CAD Coupled Laser Beam Test System for Digital Circuit Failure Analysis’, Sep. 1990, IEEE Publication, vol. 13, No. 3, pp. 490-493.

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