Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-18
2009-02-03
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S072500
Reexamination Certificate
active
07486095
ABSTRACT:
Resistances of signal paths within a interconnect structure for linking input/output (I/O) ports of an integrated circuit (IC) tester to test points of an IC are measured by the IC tester itself. To do so the interconnect structure is used to link the tester's I/O ports to a similar arrangement of test points linked to one another through conductors. Drivers within the tester, which normally transmit digital test signals to IC test points via the I/O ports when the IC is under test, are modified so that they may also either transmit a constant current through the I/O ports or link the I/O ports to ground or other reference potential. The tester then transmits known currents though the signal paths interconnecting the tester's I/O ports. Existing comparators within the tester normally used to monitor the state of an IC's digital output signals are employed to measure voltage drops between the I/O ports, thereby to provide data from which resistance of signal paths within the interconnect structure may be computed.
REFERENCES:
patent: 5101153 (1992-03-01), Morong, III
patent: 5221905 (1993-06-01), Bhangu et al.
patent: 5414351 (1995-05-01), Hsu et al.
patent: 5532600 (1996-07-01), Hoshino
patent: 5617035 (1997-04-01), Swapp
patent: 5736850 (1998-04-01), Legal
patent: 5760599 (1998-06-01), Ehiro
patent: 6022750 (2000-02-01), Akram et al.
patent: 6055661 (2000-04-01), Luk
patent: 6075374 (2000-06-01), Dakeyama
patent: 6087843 (2000-07-01), Pun et al.
patent: 6181144 (2001-01-01), Hembree et al.
patent: 6218848 (2001-04-01), Hembree et al.
patent: 6300757 (2001-10-01), Janssen
patent: 6456103 (2002-09-01), Eldridge et al.
patent: 6677744 (2004-01-01), Long
patent: 7109736 (2006-09-01), Long
patent: 19756466 (1998-07-01), None
patent: 04-129417 (1992-04-01), None
patent: 163894 (1991-07-01), None
Yasuhiko, O., “Semiconductor Integrated Circuit”,Patent Abstracts of Japan, vol. 16, No. 397, Publication No. 04129417, Apr. 30, 1992.
Burraston N. Kenneth
FormFactor Inc.
Nguyen Ha Tran T
Nguyen Tung X
LandOfFree
System for measuring signal path resistance for an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for measuring signal path resistance for an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measuring signal path resistance for an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4100862