System and method for chart pattern recognition and analysis...

Details System and method for chart pattern recognition and analysis... System and method for chart pattern recognition and analysis...

2004-06-30

2009-10-06

Cheung, Mary (Department: 3694)

Data processing: financial, business practice, management, or co

Automated electrical financial or business practice or...

Finance

C382S181000

Reexamination Certificate

active

07599867

ABSTRACT:
A system and method are provided for chart pattern recognition and analysis. In one embodiment, a graphical interface is provided to enable a trader to select a portion of a chart to be used in the chart pattern analysis. The pattern of the selected portion of the chart could then be used to find one or more similar chart patterns in a user-defined timeframe, such as any future time period or a time period in the past. When a reoccurring chart pattern is found in any future time period, an alert signal can be generated to alert a user of a possibility of the chart pattern reoccurrence. Alternatively, chart pattern matches can be found in a time period in the past, and a set of studies can be applied to the found matches to generate a set of reoccurring indicator values. The reoccurring indicator values can be used in combination with the chart pattern to detect any similar chart patterns in the future.

REFERENCES:
patent: 5465308 (1995-11-01), Hutcheson et al.
patent: 5946666 (1999-08-01), Nevo et al.
patent: 6272474 (2001-08-01), Garcia
patent: 6574600 (2003-06-01), Fishman
patent: 6694054 (2004-02-01), Gardes et al.
patent: RE38626 (2004-10-01), Kielland
patent: 6801201 (2004-10-01), Escher
patent: 6907404 (2005-06-01), Li
patent: 7181423 (2007-02-01), Blanchard et al.
patent: 2002/0007331 (2002-01-01), Lo et al.
patent: 2002/0120551 (2002-08-01), Jones, III
patent: 2003/0009411 (2003-01-01), Ram
patent: 2005/0228735 (2005-10-01), Duquette
“Creating ‘Optimally Complex’ Models for Forecasting” by John F. Elder, IV and Mark T. Finn, Financial Analysts Journal, Jan.-Feb. 1991, pp. 73-79.

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