Pattern identification and bit level measurements on...

Details Pattern identification and bit level measurements on... Pattern identification and bit level measurements on...

2005-08-02

2009-02-17

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S067000, C702S073000, C702S079000, C375S224000, C375S225000

Reexamination Certificate

active

07493223

ABSTRACT:
A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.

REFERENCES:
patent: 5295155 (1994-03-01), Gersbach et al.
patent: 2004/0078158 (2004-04-01), MacDonald
Sacchi et al., Transmission Capabilities of a Novel Multi-Wavelength Erbium-Ytterbium Glass Laser Source, vol. 6, No. 2, Feb. 1994.

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