Semiconductor test apparatus and performance board

Details Semiconductor test apparatus and performance board Semiconductor test apparatus and performance board

2006-11-14

2009-06-02

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

C324S1540PB, C324S500000

Reexamination Certificate

active

07541798

ABSTRACT:
A gain of a buffer provided on a performance board of a semiconductor test apparatus can be adjusted for testing image sensors with high accuracy. The performance board includes buffers for driving cables, and switches for inputting either a measurement signal from a device under measurement or a reference signal output from a reference signal generator. During calibration, the switches are turned to terminals to which the reference signal is input, such that the reference signal is applied to the buffers. Then, the gains of the buffers are corrected so that the output of an analog capture board has a desired value.

REFERENCES:
patent: 5945823 (1999-08-01), Noda
patent: H05-56460 (1993-03-01), None
patent: 2002-077951 (2002-03-01), None

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