Probe and method of manufacturing a probe

Details Probe and method of manufacturing a probe Probe and method of manufacturing a probe

2006-07-10

2009-11-03

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07612572

ABSTRACT:
A probe10to be used when inspecting characteristics of an object of inspection includes: a bar-shaped base member3forming a main body; a nickel plating layer4constituting a ground layer and a gold plating layer5constituting an outermost layer formed on a surface of the base member3; and a plurality of square-pyramidal1protrusions formed in a lattice-like fashion at one end of the base member3and brought into contact with the object of inspection.

REFERENCES:
patent: 6072321 (2000-06-01), Akram et al.
patent: 11-51970 (1999-02-01), None
patent: 2000-227444 (2000-08-01), None
patent: 2000-346897 (2000-12-01), None

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