Stress measurement method

Optics: measuring and testing – Material strain analysis

Reexamination Certificate

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C702S043000

Reexamination Certificate

active

07623223

ABSTRACT:
An object of this invention is to provide stress measurement method that is stress of the measuring object nondestructively in a short period of time.In order to attain this object, the stress measurement apparatus1comprises a correlation data storage section41that analyzes a correlation between reference stress related data obtained from a Raman spectrum L of an entire predetermined area W1of a reference specimen W and local stress originated data as being data obtained based on a local stress each of which applies to multiple positions WS1˜WSnrespectively in the predetermined area W1and stores correlation data indicating the correlation, a data obtaining section42that obtains measurement stress related data from a Raman spectrum L on an entire measurement area W1′, corresponding to the predetermined area W1, of a measurement specimen WS′, and a calculation section43that calculates local stress originated data in the measurement area W1′ based on the correlation data and the measurement stress related data.

REFERENCES:
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patent: 2005/0259269 (2005-11-01), Latypov et al.
patent: 2007/0146685 (2007-06-01), Yoo et al.
patent: 2008/0086276 (2008-04-01), Naka et al.
patent: 2 417 772 (2006-03-01), None
patent: 01-219529 (1989-09-01), None
patent: 2000-009664 (2000-01-01), None
patent: 2006-073866 (2006-03-01), None

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