Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-03-08
2009-11-10
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07617067
ABSTRACT:
One embodiment of the present invention provides a multi-chip package including a logic device providing a clock signal having a frequency and a memory device. The memory device receives the clock signal and operates at the clock signal frequency. The memory device includes a temperature sensor providing a temperature signal indicative of a temperature of the memory device, wherein the logic device adjusts the clock signal frequency bases on the temperature signal.
REFERENCES:
patent: 6121682 (2000-09-01), Kim
patent: 6507514 (2003-01-01), Tsao et al.
patent: 6518655 (2003-02-01), Morinaga et al.
patent: 6643136 (2003-11-01), Hsu
patent: 6683377 (2004-01-01), Shim et al.
patent: 6690089 (2004-02-01), Uchida
patent: 6731535 (2004-05-01), Ooishi et al.
patent: 7124052 (2006-10-01), Oh
patent: 7453302 (2008-11-01), Le et al.
patent: 2002/0133789 (2002-09-01), Hsu et al.
patent: 2003/0056057 (2003-03-01), Lawrence
patent: 2005/0162957 (2005-07-01), Oh
Oscillator, Answers, printed date Sep. 2, 2008.
Webster's Ninth New Collegiate Dictionary, definition of clock, 1986.
Oscillator Circuits, Integrated Publishing, printed date Sep. 9, 2008.
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Nghiem Michael P
LandOfFree
Multichip package with clock frequency adjustment does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Multichip package with clock frequency adjustment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multichip package with clock frequency adjustment will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4079303