Diagnostic device for use in process control system

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Details

C702S081000, C702S182000, C702S116000

Reexamination Certificate

active

07634382

ABSTRACT:
A method and diagnostic device are disclosed which can receive process variable values (x(t)) of a process variable of a process medium of a process, and extract and record measurement statistics data from such process variable values, which are measured during a measuring phase. Training statistics data can be extracted and recorded from such process variable values, which are measured during a training phase. The measurement statistics data can be compared with training statistics data recorded before the measurement statistics data. The training statistics data can include a training empirical statistical distribution, which can be a distribution of a function of process variable values, which are measured during a training phase, or a distribution of a function of coefficients Xt(k), which are coefficients of a function of a transform of process variable values (x(t)), which are measured during a training phase.

REFERENCES:
patent: 5987398 (1999-11-01), Halverson et al.
patent: 6601005 (2003-07-01), Eryurek et al.
patent: 2002/0029130 (2002-03-01), Eryurek et al.
patent: 2004/0193387 (2004-09-01), Jinyama
International Search Report for PCT/CH2005/000084, dated Oct. 28, 2005.

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