Method for determining temperature profile in semiconductor...

Details Method for determining temperature profile in semiconductor... Method for determining temperature profile in semiconductor...

2005-12-16

2009-12-15

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07633307

ABSTRACT:
A method is provided for testing semiconductor devices. In accordance with the method, a first usage temperature T1is obtained which represents the maximum or minimum temperature to which a semiconductor device will be exposed during its first use by a customer. The semiconductor device is then tested for defects while ramping the temperature to which the device is exposed from a first temperature T0to the temperature T1.

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