Submicron particle removal using liquid nitrogen

Cleaning and liquid contact with solids – Apparatus – With spray or jet supplying and/or applying means

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134105, 134902, B08B 302

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active

055559026

ABSTRACT:
Liquid nitrogen is introduced onto a surface of a semiconductor wafer to remove submicron particles from its surface. LN.sub.2 flows across the wafer surface wherein the surface tension of the liquid collects contaminant particles and removes them off the edge of the wafer.

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