Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed
Reexamination Certificate
2005-12-19
2009-08-11
Wojciechowicz, Edward (Department: 2895)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Optical characteristic sensed
C438S057000, C438S065000, C438S071000, C438S074000, C438S761000
Reexamination Certificate
active
07572648
ABSTRACT:
A cubic element of photonic crystal is integrally formed on the surface of a photo-detection element, and a portion of the photonic crystal cubic element is irradiated with ultraviolet rays thereby to change the refractive index of the portion of the cubic element that has been irradiated with ultraviolet rays. Alternatively, by causing globular particles having different refractive indices to eject on the surface of the photo-detection element from an ink-jet apparatus having a nozzle provided with a temperature control part by controlling temperature of the nozzle to form a laminate of globular particle layers having different refractive indices, a photonic crystal lens is integrally formed on the surface of the photo-detection element.
REFERENCES:
patent: 4895164 (1990-01-01), Wood
patent: 2003/0095755 (2003-05-01), Vaganov et al.
patent: 2005/0190456 (2005-09-01), Nishioka et al.
patent: 5-28617 (1993-04-01), None
patent: 08-191800 (1996-07-01), None
patent: 2000-193811 (2000-07-01), None
patent: 2001-042144 (2001-02-01), None
patent: 2001-281053 (2001-10-01), None
patent: 2001-160654 (2001-12-01), None
patent: 2001-349785 (2001-12-01), None
patent: 2002-048637 (2002-02-01), None
patent: 2002-048646 (2002-02-01), None
patent: 2002-048649 (2002-02-01), None
patent: 2003-133536 (2003-05-01), None
patent: 2003-346890 (2008-09-01), None
Japanese Patent Office, Application No. JP 2003-346890, Notification of Reason(s) for Refusal, dated Mar. 4, 2008.
Sato Akinobu
Suzuki Akiko
Gallagher & Lathrop
Japan Aviation Electronics Industry Limited
Lathrop, Esq. David N.
Wojciechowicz Edward
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