Clearance measurement systems and methods of operation

Details Clearance measurement systems and methods of operation Clearance measurement systems and methods of operation

2005-09-16

2008-12-16

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Distributive type parameters

C324S646000, C324S662000

Reexamination Certificate

active

07466143

ABSTRACT:
A method is provided and includes exciting a sensor with an incident signal and generating a reflected signal by reflecting the incident signal from the sensor. The incident signal and the reflected signal interfere to form a standing wave. The method also includes processing the signals to determine a sensed parameter based upon a frequency at which the standing wave exhibits a null.

REFERENCES:
patent: 3898472 (1975-08-01), Long
patent: 4045727 (1977-08-01), Yu et al.
patent: 5070302 (1991-12-01), Marcus et al.
patent: 5101165 (1992-03-01), Rickards
patent: 5119036 (1992-06-01), Rickards et al.
patent: 5166626 (1992-11-01), Hester et al.
patent: 5353798 (1994-10-01), Sieben
patent: 5564434 (1996-10-01), Halperin et al.
patent: 5581257 (1996-12-01), Greene et al.
patent: 5748005 (1998-05-01), McCormick et al.
patent: 5933550 (1999-08-01), Fujieda et al.
patent: 5990807 (1999-11-01), Cloutier et al.
patent: 6163723 (2000-12-01), Roberts et al.
patent: 6239601 (2001-05-01), Weinstein
patent: 6401541 (2002-06-01), Kurtz
patent: 6420882 (2002-07-01), Engebretsen et al.
patent: 6441623 (2002-08-01), Moon
patent: 6593755 (2003-07-01), Rosengren
patent: 6668614 (2003-12-01), Itakura
patent: 6717418 (2004-04-01), Orenstein
patent: 6744264 (2004-06-01), Gogoi et al.
patent: 6788112 (2004-09-01), Chan et al.
patent: 6876209 (2005-04-01), Lin et al.
patent: 6944359 (2005-09-01), Kamei et al.
patent: 7180305 (2007-02-01), Andarawis et al.
patent: 2003/0011378 (2003-01-01), Ishio et al.
patent: 2003/0094956 (2003-05-01), Orenstein
patent: 2003/0215323 (2003-11-01), Prinz et al.
patent: 2004/0158980 (2004-08-01), Nakatani et al.
patent: 2004/0265488 (2004-12-01), Hardwicke et al.
patent: 2005/0052268 (2005-03-01), Pleskach et al.
patent: 2005/0077911 (2005-04-01), Miyasaka
patent: 2005/0103112 (2005-05-01), Pedersen et al.
patent: 2006/0006960 (2006-01-01), Lin et al.
patent: 2006/0066318 (2006-03-01), Andarawis et al.
patent: 2006/0103003 (2006-05-01), Heide et al.
patent: 2006/0125492 (2006-06-01), Andarawis et al.
patent: 2006/0132147 (2006-06-01), Balasubramaniam et al.
patent: 2006/0239813 (2006-10-01), Shah et al.
J. A. Ruud et al., “Sensor Assembly, Transformers and Methods of Manufacture,” U.S. Appl. No. 11/528,236, filed Sep. 27, 2006.

Affiliated with

Also associated with

Rating

Clearance measurement systems and methods of operation does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Clearance measurement systems and methods of operation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Clearance measurement systems and methods of operation will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4050195