Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2005-12-08
2008-12-23
Chen, Kin-Chan (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S719000
Reexamination Certificate
active
07468324
ABSTRACT:
A method of fabricating microelectromechanical (MEMs) systems and in particular for producing silicon carbide (SiC) MEMs devices with improved mechanical properties. The method comprises reacting a dry etch plasma with a layered microstructure; the layered microstructure having an etch mask, a sacrificial layer and a device layer arranged between the etch mask and the sacrificial layer. The dry etch plasma is introduced into the environment of the layered microstructure such that the device layer is etched anisotropically and the sacrificial layer is etched substantially isotropically. The invention also provides a method for tuning MEMs devices by material de-stressing using an inert gas in the dry etch plasma.
REFERENCES:
patent: 4352724 (1982-10-01), Sugishima et al.
patent: 5767017 (1998-06-01), Armacost et al.
patent: 5882468 (1999-03-01), Crockett et al.
patent: 6174806 (2001-01-01), Thakur et al.
patent: 6492283 (2002-12-01), Raaijmakers et al.
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6815243 (2004-11-01), Lucak et al.
patent: 2003/0060051 (2003-03-01), Kretschmann et al.
patent: 2003/0062322 (2003-04-01), Walton et al.
L. Jiang et al., “Dry release fabrication and testing of SiC electrostatic cantilever actuators,” Microelectronic Engineering, 78-79 (2005) pp. 106-111.
Y.T. Yang et al., “Monocrystalline silicon carbide nanoelectromechanical systems,” Applied Physics Letters, vol. 78, No. 2, pp. 162-164, Jan. 8, 2001, American Institute of Physics.
L. Jiang et al., “Fabricaton of SiC microelectromechanical systems (MEMS) using one-step dry etching,” J. Vac. Sci. Technol. B 21(6), Nov./Dec. 2003, pp. 1-4, American Vacuum Society.
Cheung Rebecca
Jiang Liudi
Chen Kin-Chan
RatnerPrestia
The University Court of the University of Edinburgh
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