Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-15
2008-08-26
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07417447
ABSTRACT:
Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.
REFERENCES:
patent: 6246245 (2001-06-01), Akram et al.
patent: 6350953 (2002-02-01), Franzen
patent: 6367150 (2002-04-01), Kirsten
patent: 2002/0153913 (2002-10-01), Okubo et al.
patent: 0 681 186 (1995-11-01), None
Lumen Patent Firm, Inc.
Micro-Probe, Inc.
Nguyen Ha
Nguyen Trung Q.
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