Error detection apparatus and method and signal extractor

Details Error detection apparatus and method and signal extractor Error detection apparatus and method and signal extractor

2006-01-19

2008-10-07

Lau, Tung S. (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S108000, C324S500000, C324S537000, C324S763010, C324S765010, C714S718000, C714S719000, C714S735000, C714S736000, C714S819000, C714S824000, C365S189011, C365S201000

Reexamination Certificate

active

07433793

ABSTRACT:
A modulated voltage signal modulated at a predetermined frequency f0is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal containing information on power supply current flowing through the integrated circuit under test at the stationary point. Then, a determination signal from which DC component is removed is extracted from the observation signal and supplied to a determination device. The determination device compares the size of spectral component of the determination signal at the predetermined frequency f0between each measurement point and determines that an error exists in the integrated circuit under test if a difference is a predetermined value or greater.

REFERENCES:
patent: 6088819 (2000-07-01), Adachi et al.
patent: 6351835 (2002-02-01), Sakaguchi
patent: 6995554 (2006-02-01), Loke et al.
patent: 2001/0040379 (2001-11-01), Sakaguchi
patent: 2001/0043079 (2001-11-01), Sakaguchi
patent: 2004/0263198 (2004-12-01), Binkley et al.
patent: 2003-185698 (2003-07-01), None

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