Optical: systems and elements – Deflection using a moving element
Reexamination Certificate
2006-03-15
2008-10-14
Phan, James (Department: 2872)
Optical: systems and elements
Deflection using a moving element
C359S205100, C359S385000, C359S388000
Reexamination Certificate
active
07436562
ABSTRACT:
It is possible to easily and accurately confirm the position of an optical axis of an objective lens relative to an examination site on a specimen, and positioning of the objective relative to the specimen can be carried out rapidly in a preparation stage. The invention provides scanning examination apparatus comprising a first light source; a light scanning unit configured to scan light from the first light source on a specimen; an objective lens configured to form an image of the light scanned in the light scanning unit at the specimen; a light-detecting unit configured to detect return light emitted from the specimen; a second light source configured to emit visible light; a deflecting optical element, disposed between the light scanning unit and the objective lens, for making visible light emitted from the second light source enter the objective lens along an optical axis of the objective lens; and a beam-shaping unit configured to form the visible light from the second light source, which is irradiated onto a surface of the specimen via the objective lens using the deflecting optical element, into a pattern that enables the optical axis of the objective lens to be indicated.
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European Office Action dated Nov. 9, 2007 for corresponding EP Application No. 06 005 109.1—1524, 6 pp.
Nagasawa Nobuyuki
Osa Kazuhiko
Saito Yoshiharu
Tanikawa Yoshihisa
Olympus Corporation
Phan James
Pillsbury Winthrop Shaw & Pittman LLP
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