Semiconductor device and manufacturing method therefor

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Heterojunction formed between semiconductor materials which...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S183000, C257S201000, C257S615000, C257SE33049

Reexamination Certificate

active

07394114

ABSTRACT:
A laser diode includes a first n-cladding layer disposed on and lattice-matched to an n-semiconductor substrate, wherein the first n-cladding layer is n-AlGaInP or n-GaInP; a second n-cladding layer of n-AlGaAs supported by the first n-cladding layer; and an inserted layer disposed between the first n-cladding layer and the second n-cladding layer, wherein the inserted layer includes the same elements as the first n-cladding layer, the inserted layer has the same composition ratios of Al and Ga (and P) as the first n-cladding layer, and the inserted layer contains a lower composition ratio of In than the first n-cladding layer.

REFERENCES:
patent: 5153889 (1992-10-01), Sugawara et al.
patent: 5684309 (1997-11-01), McIntosh et al.
patent: 5859864 (1999-01-01), Jewell
patent: 6849881 (2005-02-01), Harle et al.
patent: 7049212 (2006-05-01), Nakamura et al.
patent: 7208774 (2007-04-01), Hashimoto et al.
patent: 7235816 (2007-06-01), Takahashi et al.
patent: 2002/0171091 (2002-11-01), Goetz et al.
patent: 2005/0127397 (2005-06-01), Borges et al.
patent: 2005/0285127 (2005-12-01), Noto et al.
patent: 2006/0091421 (2006-05-01), Ono et al.
patent: 2006/0118914 (2006-06-01), Yoo
patent: 2000-91707 (2000-03-01), None
T. Nittono et al.; “Photoluminescence characterization of InGaP/GaAs heterostructures grown by metalorganic chemical vapor deposition”,J. of Applied Physics, vol. 78, No. 9 (Nov. 1, 1995) pp. 5387-5390.
D. P. Bour, et al.; “Ga0.5In0.5P/GaAs interfaces by organometallic vapor-phase epitaxy”,J. of Applied Physics, vol. 63, No. 4, (Feb. 15, 1988), pp. 1241-1243.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and manufacturing method therefor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and manufacturing method therefor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method therefor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3968110

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.