Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Reexamination Certificate
2005-04-29
2008-01-29
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
C438S151000, C438S164000, C438S459000, C438S479000, C438S682000, C257SE21567
Reexamination Certificate
active
07323396
ABSTRACT:
The present invention describes a method including the steps of providing a single crystal semiconductor substrate, forming a layer of rare earth silicide on a surface of the semiconductor substrate, forming a first layer of insulating material on the layer of rare earth silicide, forming a layer of electrically conductive material on the first layer of insulating material, and forming a second layer of insulating material on the layer of electrically conductive material. In one embodiment the step of forming the layer of rare earth silicide includes depositing a layer of rare earth metal on a surface of the semiconductor substrate depositing a layer of insulating material on the layer of rare earth metal, and annealing the structure to form a layer of rare earth silicide in conjunction with the surface of the semiconductor substrate and a rare earth doped insulating layer in conjunction with the layer of insulating material.
REFERENCES:
patent: 5387555 (1995-02-01), Linn et al.
patent: 5798297 (1998-08-01), Winnerl et al.
patent: 2002/0151158 (2002-10-01), Cabral et al.
Atanackovic Petar B.
Lebby Michael
Goltry Michael W.
Parsons Robert A.
Parsons & Goltry
Translucent Inc.
Trinh Michael
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