Method of making current-perpendicular-to-the-plane...

Metal working – Method of mechanical manufacture – Electrical device making

Reexamination Certificate

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C029S603070, C029S603130, C029S603120, C216S022000, C427S128000, C427S282000

Reexamination Certificate

active

07343665

ABSTRACT:
The lower electrode is at least exposed at the surface of a substructure layer in a current-perpendicular-to-the-plane structure magnetoresistive element. A resist is formed to extend over the surface of the substructure layer. A patterning void is defined in the resist. The shape of the patterning void is designed to correspond to the contour of the magnetoresistive multilayered film. The magnetoresistive multilayered film is formed by deposition within the patterning void. This method enables avoidance of a dry etching process effected on the magnetoresistive multilayered film. Scrapings or waste of the magnetoresistive multilayered film are not generated at all. The side surfaces of the magnetoresistive multilayered film are completely prevented from attachment or adhesion of scrapings or waste. The side surfaces of the magnetoresistive multilayered film are kept stainless.

REFERENCES:
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patent: 5491600 (1996-02-01), Chen et al.
patent: 5843521 (1998-12-01), Ju et al.
patent: 5992004 (1999-11-01), Sato et al.
patent: 7130162 (2006-10-01), Seyama et al.
patent: 2006/0272146 (2006-12-01), Seyama et al.
patent: 59-195887 (1984-11-01), None
patent: 11-120758 (1999-04-01), None
patent: 2000-277523 (2000-10-01), None
patent: 2001-237469 (2001-08-01), None

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