Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-03-25
2008-03-25
Pert, Evan (Department: 2826)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11393953
ABSTRACT:
A probing card and an inspection apparatus which precisely inspect a microstructure having a minute moving section by a simple method are provided. A probing card (6) has a speaker (2), and a circuit substrate (100) which fixes a probe (4), and the speaker (2) is disposed on the circuit substrate (100). The circuit substrate (100) is provided with an aperture region. As the speaker (2) is disposed on that region, a test sound wave is output to the moving section of the microstructure. The probe (4) detects a change in an electrical characteristic caused by the motion of the moving section according to the test sound wave, thereby inspecting the characteristic of the microstructure.
REFERENCES:
patent: 4816125 (1989-03-01), Muller et al.
patent: 6232790 (2001-05-01), Bryan et al.
patent: 2005/0279170 (2005-12-01), Okumura et al.
patent: 1 085 784 (2001-03-01), None
patent: 1-502581 (1989-09-01), None
patent: 2-67956 (1990-03-01), None
patent: 5-34371 (1993-02-01), None
patent: 6-313785 (1994-11-01), None
patent: 9-33567 (1997-02-01), None
patent: 11-2643 (1999-01-01), None
patent: 548408 (2003-08-01), None
patent: 200403439 (2004-03-01), None
European Search Report issued in corresponding Application No. 06006889.7 - 1528, dated Jul. 27, 2007.
Ikeuchi Naoki
Yakabe Masami
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Pert Evan
LandOfFree
Probing card and inspection apparatus for microstructure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probing card and inspection apparatus for microstructure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probing card and inspection apparatus for microstructure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3957842