Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2008-04-08
2008-04-08
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
C714S026000, C706S013000
Reexamination Certificate
active
11053598
ABSTRACT:
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
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J. Kennedy and R. Mendes
Buxton Paul
Gorin Jacky
Miguelanez Emilio
Scott Michael J.
Tabor Paul
Barlow John
Khuu Cindy D.
Noblitt & Gilmore LLC
Test Advantage, Inc.
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