Interferometric optical profiler

Optics: measuring and testing – By light interference – Having wavefront division

Reexamination Certificate

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Reexamination Certificate

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11015051

ABSTRACT:
An imaging-type interferometric optical profiler splits a beam reflected from a sample into two beam portions. One portion is a reference beam and the other a sample beam. The reference and sample beams are combined to create interference patterns which are used to obtain a surface profile of the sample. Since vibration of the sample causes the same optical path change, and no reference mirror is used, the interferometric optical profiler is relatively vibration-insensitive and has a fast measurement speed.

REFERENCES:
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patent: 4732483 (1988-03-01), Biegen
patent: 6559953 (2003-05-01), Davids
patent: 6819435 (2004-11-01), Arieli et al.
patent: 6850329 (2005-02-01), Tobiason et al.
patent: 7023563 (2006-04-01), Li
patent: 2002/0027661 (2002-03-01), Arieli et al.
patent: 2002/0191894 (2002-12-01), Culver et al.
patent: 2005/0030548 (2005-02-01), Li

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