Method of fabricating a semiconductor integrated circuit...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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C438S125000, C438S946000, C257SE21511, C430S005000, C430S313000

Reexamination Certificate

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11714837

ABSTRACT:
Productivity of a semiconductor integrated circuit device is improved. According to how many times the photomask is used, a photomask having an opaque pattern made of metal and a photomask having an opaque pattern made of a resist film are properly used, and thereby an exposure treatment is performed.

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patent: 5899719 (1999-05-01), Hong
patent: 6060769 (2000-05-01), Wark
patent: 6656646 (2003-12-01), Hotta et al.
patent: 6846598 (2005-01-01), Hasegawa et al.
patent: 2002/0042007 (2002-04-01), Miyazaki et al.
patent: 05-289307 (1992-04-01), None
patent: 2000-91192 (2000-03-01), None
International Search Reported dated Oct. 15, 2001 for PCT/JP01/07035.
International Preliminary Examination Report dated Apr. 19, 2002 for PCT/JP01/07035.
Chinese Office Action dated Nov. 18, 2005.

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