System microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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Details

C359S372000, C359S373000, C359S385000, C359S388000, C359S389000

Reexamination Certificate

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11104844

ABSTRACT:
A system microscope has a specimen mounting part which mounts a specimen, an inverted microscope including an illumination path which radiates illumination light from under the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, a microscope with upright frame including an illumination path which radiates illumination light from above the specimen mounting part, and an observation optical path which acquires detection light emitted from the specimen to which the illumination light is radiated, and a driving unit which moves at least one of the inverted microscope and the microscope with upright frame in a plane perpendicular to the observation optical path of the inverted microscope or the microscope with upright frame.

REFERENCES:
patent: 4619503 (1986-10-01), Reinheimer et al.
patent: 5061074 (1991-10-01), Ohikata et al.
patent: 5750989 (1998-05-01), Lindsay et al.
patent: 5760396 (1998-06-01), Lindsay et al.
patent: 2002/0151397 (2002-10-01), Takahama
patent: 33 43 112 (1985-06-01), None
patent: 1 582 904 (2005-10-01), None
patent: 2000-89124 (2000-03-01), None
patent: 2002-55282 (2002-02-01), None
patent: 1179253 (1985-09-01), None

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