Method for manufacture of integrated semiconductor circuits, in

Metal working – Method of mechanical manufacture – Assembling or joining

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29571, 29578, 29579, 29580, 148174, 156644, 156653, 156657, 156662, 357 24, 357 59, H01L 2120, H01L 21283

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043511007

ABSTRACT:
In an exemplary embodiment, a first polysilicon layer is provided with a SiO.sub.2 mask, and the first polysilicon layer is etched away under the SiO.sub.2 mask to produce SiO.sub.2 overhangs of a lateral extent corresponding to about twice the edge position error (.sup..+-. s). Then when second polysilicon layers are produced by means of chemical vapor deposition (CVD), to occupy the cavities under the SiO.sub.2 overhangs, the desired nonoverlapping poly-Si-2 electrodes result after definition of those poly-Si-2 electrodes by known lithographical techniques.

REFERENCES:
patent: 3927468 (1975-12-01), Anthony et al.
patent: 3941630 (1976-03-01), Larrabee
patent: 4035906 (1977-07-01), Tasch et al.
patent: 4055885 (1977-11-01), Takemoto
patent: 4141765 (1979-02-01), Druminski et al.
patent: 4178396 (1979-12-01), Okano et al.
patent: 4240196 (1980-12-01), Jacobs et al.
Browne et al., "Nonoverlapping Gate Charge-Coupling . . . Applications", IEEE J. Solid-State Circuits, vol. SC 11, No. 1, Feb. 1976, pp. 203-207.

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