Element for detecting the amount of lapping having a...

Details Element for detecting the amount of lapping having a... Element for detecting the amount of lapping having a...

2008-09-09

2008-09-09

Morgan, Eileen P. (Department: 3723)

Abrading

Precision device or process - or with condition responsive...

Computer controlled

C451S009000, C451S010000, C451S041000, C216S061000, C029S603120, C029S603150, C156S345280

Reexamination Certificate

active

11808313

ABSTRACT:
An element for detecting an amount of lapping of a stacked structure that includes a substrate and a magnetic field detecting sensor is provided. The element comprises: a resistive film that is arranged on a lapping surface of the stacked structure, the resistive film being exposed at the lapping surface together with the magnetic field detecting sensor, wherein the resistive film has a resistance value that varies depending on the amount of lapping; and a pad for measuring the resistance value, wherein the pad is formed on a surface of the stacked structure, the surface being other than the lapping surface, and wherein the pad is electrically connected to one end of the resistive film. Another end of the resistive film is electrically connected to the substrate.

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