Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-01-29
2008-01-29
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
11522984
ABSTRACT:
A probe device includes a tester; a probe card; a base card holder; an auxiliary card holder for adaptively mounting the probe card to the base card holder; and a conversion ring for allowing the auxiliary card holder to be fitted to the base card holder. In the probe device, the base card holder is configured to accommodate any one of selected different conversion rings and the conversion ring is the one chosen from the different conversion rings according to the probe card.
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patent: 6114869 (2000-09-01), Williams et al.
patent: 6118290 (2000-09-01), Sugiyama et al.
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patent: 63-299243 (1988-12-01), None
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patent: 2000-349128 (2000-12-01), None
Nguyen Ha Tran
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
Velez Roberto
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