Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-04-08
2008-04-08
Benson, Walter (Department: 4158)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C713S340000, C713S322000
Reexamination Certificate
active
11620673
ABSTRACT:
A method of determining impedance comprising: supplying power to a powered device from a power sourcing equipment at a first current limited level, Ilim1; measuring, at a plurality of times a voltage associated with the output of the power sourcing equipment; determining a minimum voltage, Vmin1, of the measured plurality of voltages; determining an associated time of the determined Vmin1; removing the supplied power from the powered device; subsequent to the removing, supplying power to the powered device from the power sourcing equipment at a second current limited level, Ilim2, the Ilim2being different than the Ilim1; measuring, at the determined associated time in relation to the beginning of the supplying power at the Ilim2, a voltage associated with the output of the power sourcing equipment, Vmin2; and determining an impedance responsive to the Vmin1, Vmin2, Ilim1and Ilim2.
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IEEE Standards—802.3af-2003, pp. 36-57 (sections 33.2.3.7-33.3.6.1), p. 94-96; p. 102, p. 115, published Jun. 18, 2003, New York.
Baldridge Benjamin M
Benson Walter
Kahn Simon
Microsemi Corp. - Analog Mixed Signal Group Ltd.
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