Methods and apparatus for integrated circuit loopback testing

Details Methods and apparatus for integrated circuit loopback testing Methods and apparatus for integrated circuit loopback testing

2008-07-01

2008-07-01

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11433128

ABSTRACT:
Methods and apparatus are provided for performing loopback testing of integrated circuits (“ICs”). In an embodiment of the invention, an IC can be tested on an undiced wafer by coupling a wireless transmitter of the IC to a wireless receiver of the IC. Core circuitry of the IC can be controlled to cause the transmitter to send at least one signal to the receiver. Upon receipt of the at least one signal, the receiver can send a signal to the core circuitry, which can determine, and possibly record, whether the transmission and receipt were successful. The invention advantageously facilitates efficient testing of unpackaged ICs at the wafer level.

REFERENCES:
patent: 6777971 (2004-08-01), Kirloskar et al.
patent: 6791312 (2004-09-01), Kulhalli et al.
patent: 6940263 (2005-09-01), Henriksson
patent: 7190931 (2007-03-01), Casper et al.
Srenik Mehta et al., “An 802.11g WLAN SoC,”Digest of Technical Papers, 2005 IEEE International Solid-State Circuits Conference, Feb. 7, 2005.
Srenik Mehta et al., “An 802.11g WLAN SoC,” 2005 IEEE International Solid-State Circuits Conference, 2005.

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