Method and apparatus for performing second harmonic optical...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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C356S489000

Reexamination Certificate

active

10970485

ABSTRACT:
The invention is an apparatus and method for second harmonic optical coherence tomography of a sample comprising a laser coupled to an interferometer which has a reference arm and in a sample arm. A nonlinear crystal in the reference arm generates a second harmonic reference signal. The sample typically backscatters some second harmonic light into the sample arm. A broadband beam splitter optically coupled to the reference arm and sample arm combines the signals from the reference arm and sample arm into interference fringes and a dichroic beam splitter splits the interference fringes into a fundamental and second harmonic interference signal. A detector is optically coupled to the dichroic beam splitter detects interference fringes from which both an OCT and second harmonic OCT image can be constructed using a conventional data processor.

REFERENCES:
patent: 6608717 (2003-08-01), Medford et al.
patent: 6611339 (2003-08-01), Yang et al.

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