Semiconductor integrated circuit apparatus, measurement...

Details Semiconductor integrated circuit apparatus, measurement... Semiconductor integrated circuit apparatus, measurement...

2007-12-11

2007-12-11

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

10926364

ABSTRACT:
A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

REFERENCES:
patent: 5498972 (1996-03-01), Haulin
patent: 6140833 (2000-10-01), Flietner et al.
patent: 6545460 (2003-04-01), Sugamori
patent: 6842027 (2005-01-01), Liu et al.
patent: 6897674 (2005-05-01), Braceras et al.
patent: 5-326845 (1993-12-01), None
patent: 8-195406 (1996-07-01), None
patent: 11-31399 (1999-02-01), None
patent: 2003-7838 (2003-01-01), None
patent: 2003-529145 (2003-09-01), None

Affiliated with

Also associated with

Rating

Semiconductor integrated circuit apparatus, measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit apparatus, measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit apparatus, measurement... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3898322