Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-08-14
2007-08-14
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S075000, C702S076000, C702S126000, C375S354000, C341S155000, C341S126000, C370S343000, C324S076680
Reexamination Certificate
active
11349782
ABSTRACT:
An acquisition apparatus for a test and measurement instrument includes an input to receive an input signal, a digitizer to digitize a selected signal, a bypass path to selectively couple the input to the digitizer, a frequency shift path to frequency shift the input signal and selectively couple the frequency-shifted input signal to the digitizer, the frequency shift path including a means for frequency shifting, an input switch to switch the input signal to one of the bypass path and the frequency shift path, and an output switch to provide the selected signal to the digitizer by selectively coupling an output of one of the frequency shift path and the bypass path to the digitizer.
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Gray Francis L.
Lenihan Thomas F.
Meeker Derek
Tektronix Inc.
Tsai Carol S. W.
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