Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-02-20
2007-02-20
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
11166431
ABSTRACT:
A method of processing a substrate is provided. The method includes providing a substrate having a first surface, a second surface, and conductive paths extending from the first surface to the second surface. The method also includes (1) covering a portion of the first surface with a conductive material, and (2) removing a portion of the conductive material to define conductive traces on the first surface.
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C4 Probe Card Space Transformer Technology Overview, Chan, Leung, Southwest Test Workshop 2000, 24 pages, Jun. 2000.
Brokaw Christopher J.
Hickman Palermo & Truong & Becker LLP
SV Probe, Ltd.
Tang Minh N.
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