Circuit having a long device configured for testing

Details Circuit having a long device configured for testing Circuit having a long device configured for testing

2007-10-16

2007-10-16

Pert, Evan (Department: 2826)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11474852

ABSTRACT:
An integrated device includes a redundant bond pad for accessing internal circuitry in the event that the main bond pad for that circuitry is difficult to access with testing equipment. Signals from the redundant bond pad are biased to ground during normal operations of the integrated device. In order to test the relevant internal circuitry, a voltage is applied to a Test Mode Enable bond pad, overcoming the bias that grounds the redundant bond pad. In addition, the signal from the Test Mode Enable bond pad serves to ground any transmission from the main bond pad. As a result, the redundant bond pad may be used to test the relevant internal circuitry given its accessible location in relation to the testing equipment.

REFERENCES:
patent: 4609833 (1986-09-01), Guterman
patent: 5286656 (1994-02-01), Keown
patent: 5307010 (1994-04-01), Chiu
patent: 5323350 (1994-06-01), McLaury
patent: 5339277 (1994-08-01), McClure
patent: 5341336 (1994-08-01), McClure
patent: 5424988 (1995-06-01), McClure
patent: 5444366 (1995-08-01), Chiu
patent: 5504369 (1996-04-01), Dasse
patent: 5504389 (1996-04-01), Dickey
patent: 5532614 (1996-07-01), Chiu
patent: 5592736 (1997-01-01), Akram
patent: 5619462 (1997-04-01), McClure
patent: 5619482 (1997-04-01), Tezuka
patent: 5657266 (1997-08-01), McLaury
patent: 5727001 (1998-03-01), Loughmiller
patent: 5742555 (1998-04-01), Marr et al.
patent: 5796266 (1998-08-01), Wright
patent: 5818251 (1998-10-01), Intrater
patent: 5859442 (1999-01-01), Manning
patent: 5896039 (1999-04-01), Brannigan et al.
patent: 5896040 (1999-04-01), Brannigan et al.
patent: 6107111 (2000-08-01), Manning
patent: 6133053 (2000-10-01), Wright
patent: 6137338 (2000-10-01), Marum
patent: 6500682 (2002-12-01), Manning
patent: 6600359 (2003-07-01), Manning
patent: 6781397 (2004-08-01), Manning
patent: 305935 (1989-03-01), None
patent: 3-196536 (1991-08-01), None
patent: 4-333252 (1992-11-01), None
patent: WO82/00917 (1982-03-01), None

Affiliated with

Also associated with

Rating

Circuit having a long device configured for testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit having a long device configured for testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit having a long device configured for testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3885005