Printed circuit board test access point structures and...

Electricity: conductors and insulators – Conduits – cables or conductors – Preformed panel circuit arrangement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S763010

Reexamination Certificate

active

10670649

ABSTRACT:
A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.

REFERENCES:
patent: 5416274 (1995-05-01), Ushiyama et al.
patent: 5680056 (1997-10-01), Ito et al.
patent: 6686758 (2004-02-01), Farnworth et al.
patent: 2001/0002728 (2001-06-01), Tsukada et al.
patent: 2004/0150388 (2004-08-01), Cheng et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Printed circuit board test access point structures and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Printed circuit board test access point structures and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Printed circuit board test access point structures and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3870245

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.