Positive resist composition and patterning process

Radiation imagery chemistry: process – composition – or product th – Diazo reproduction – process – composition – or product – Composition or product which contains radiation sensitive...

Reexamination Certificate

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C430S191000, C430S192000, C430S193000, C430S326000

Reexamination Certificate

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10936621

ABSTRACT:
A positive resist composition comprising a mixture of an alkali-soluble novolak resin prepared using m-cresol, p-cresol and 2,5-xylenol as starting reactants and a phenolic compound, wherein the hydrogen atoms of all hydroxyl groups are substituted in a proportion of 0.03–0.05 mol per hydrogen atom with 1,2-naphthoquinonediazidosulfonyl ester groups, has uniformity, high sensitivity and high resolution, and is improved in heat resistance, film retention, substrate adhesion, and storage stability.

REFERENCES:
patent: 5738968 (1998-04-01), Hosoda et al.
patent: 6210855 (2001-04-01), Ueda et al.
patent: 6773858 (2004-08-01), Kato et al.
patent: 6911292 (2005-06-01), Furihata et al.
patent: 2002/0182531 (2002-12-01), Mizuta et al.
patent: 9-319078 (1997-12-01), None
patent: 2002-296772 (2002-10-01), None
“Challenge of Intelligence for Future Break Through,” Feb. 1992, p. 18-20.

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