Systems, methods and apparatus for determining deviation of...

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

Reexamination Certificate

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C600S434000

Reexamination Certificate

active

11002007

ABSTRACT:
Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.

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patent: 6494824 (2002-12-01), Apple et al.
Unfors; Direct X-ray Ruler brochure., Jul. 28, 2004, Uggledalsvagen 29, SE-427 40 Billdal, Sweden.

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