Systems, methods and apparatus for determining deviation of...

Details Systems, methods and apparatus for determining deviation of... Systems, methods and apparatus for determining deviation of...

2007-02-13

2007-02-13

Gabor, Otilia (Department: 2884)

Radiant energy

Invisible radiant energy responsive electric signalling

Semiconductor system

C600S434000

Reexamination Certificate

active

11002007

ABSTRACT:
Systems, methods and apparatus are provided through which, in some embodiments, an electronic sensor is positioned in the field of projection of an X-ray source, and the electronic sensor measures the deviation between a visible light field and an X-ray field. In some embodiments, the deviation is scaled in reference to the position of the electronic sensor between an X-ray receptor and the X-ray source.

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Unfors; Direct X-ray Ruler brochure., Jul. 28, 2004, Uggledalsvagen 29, SE-427 40 Billdal, Sweden.

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