Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2007-12-25
2007-12-25
Leja, Ronald W. (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
11015813
ABSTRACT:
Disclosed is an ESD protection circuit for use in a semiconductor memory device with enhanced ESD efficiency. The ESD protection circuit includes: an input pad for receiving a data; a data input buffer for transmitting the data inputted from the input pad to an internal circuit; a first discharging means for a HBM/MM ESD connected to the input pad; and a second discharging means provided with at least one diode for a CDM ESD, disposed between the first discharging means and the data input buffer.
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Hynix / Semiconductor Inc.
Leja Ronald W.
Lowe Hauptman & Ham & Berner, LLP
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