Operation voltage supply apparatus and operation voltage...

Details Operation voltage supply apparatus and operation voltage... Operation voltage supply apparatus and operation voltage...

2007-12-11

2007-12-11

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB, C323S273000

Reexamination Certificate

active

10936675

ABSTRACT:
The voltage application probe (54) and the voltage measurement probe (56) are connected to the voltage application pad (74) and the voltage measurement pad (76) of the semiconductor device (70). The voltage application pad (74) and the voltage measurement pad (76) are connected by the conductor (78), measuring the voltage applied to the voltage application pad (74) through the voltage measurement probe (56). The voltage compensation circuit (14) in the voltage development device (10) operates to make the voltage applied to the voltage application pad (74) equal to the set voltage for the voltage development device (10). Even when the resistance between the voltage application probe (54) and the voltage application pad (74) increases, the accurate setting voltage is applied to the voltage application pad (74).

REFERENCES:
patent: 7053634 (2006-05-01), Okajima
patent: 2002/0011853 (2002-01-01), Noda
patent: 2004/0041581 (2004-03-01), Saijyo et al.
patent: 2006/0061374 (2006-03-01), Shinozaki et al.
patent: 2000-206146 (2000-07-01), None

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