Methods and apparatus for inspecting an object

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Reexamination Certificate

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C250S208100, C250S559090, C250S559050, C356S369000

Reexamination Certificate

active

11256886

ABSTRACT:
A method for inspecting an object using a structured light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, polarizing each of a plurality of different wavelengths of the light emitted from the light source at different polarization angles, projecting light emitted from the light source onto a surface of an object, receiving light reflected from the object surface with the imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.

REFERENCES:
patent: 4585947 (1986-04-01), Liptay-Wagner et al.
patent: 4686374 (1987-08-01), Liptay-Wagner et al.
patent: 4864123 (1989-09-01), Mizutani et al.
patent: 5307151 (1994-04-01), Hof et al.
patent: 5910841 (1999-06-01), Masao
patent: 6028671 (2000-02-01), Svetkoff et al.
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6559942 (2003-05-01), Sui et al.
patent: 6639685 (2003-10-01), Gu et al.
patent: 6678057 (2004-01-01), Harding et al.
patent: 6714301 (2004-03-01), Otsuki et al.
patent: 2002/0014577 (2002-02-01), Ulrich et al.
patent: 2003/0112447 (2003-06-01), Harding et al.
patent: 2003/0223083 (2003-12-01), Geng
patent: 2004/0026622 (2004-02-01), DiMarzio et al.
patent: 2005/0073590 (2005-04-01), Mamiya
patent: 2005/0111726 (2005-05-01), Hackney et al.
patent: 2004013566 (2004-02-01), None
Qinguing Hu et al., “Shiny Parts Measurement Using Color Separation,” Oct. 24, 2005, GE GRC Schenectady, NY (8 pages).
Search Report;Reference No. 165253/11842, Application No. 06255431.6—2213; Place of Search—Munich; Dated Feb. 23, 2007; 6 pgs.

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