Signature analysis using random probing and signature memory

Details Signature analysis using random probing and signature memory Signature analysis using random probing and signature memory

1982-12-06

1985-07-02

Smith, Jerry

Excavating

371 26, G01R 3128, G06F 1100

Patent

active

045272727

ABSTRACT:
A circuit test system using signature analysis allows random probing to detect faults in an assembly under test. Test points on a properly working assembly are probed at random and the signatures obtained are listed in a memory or storage media. Thereafter, when testing other boards these same test points are probed randomly and the signatures are compared to the list of possible good signatures. If a match is found a "pass" indication is generated and the operator tests another node. If a match is not found, a "failure" indication is generated and more detailed troubleshooting of circuits at that test node commences.

REFERENCES:
patent: 4058851 (1977-12-01), Scheuneman
patent: 4099668 (1978-07-01), Feilchenfeld et al.
patent: 4194113 (1980-03-01), Fulks et al.
patent: 4312067 (1982-01-01), Shirasaka
patent: 4385385 (1983-05-01), Duplessis et al.

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