Sample machining device and sample analysis device

Measuring and testing – Sampler – sample handling – etc. – Capture device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S864810

Reexamination Certificate

active

11058543

ABSTRACT:
The invention relates to a sample machining device, in particular for preparing samples for OES and/or XRF and/or combustion analyses, having at least one sample holder, and to provide a development which is advantageous in use proposes that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and that at least one additional tool, in particular a drilling or separate milling tool, is provided in order to produce chips from the remainder piece of the sample. Moreover, the invention relates to a sample analysis device in which, according to the invention, the abovementioned sample machining device and means for carrying out OES analysis and/or XRF analysis and/or combustion analysis are provided.

REFERENCES:
patent: 2276757 (1942-03-01), Baines
patent: 4322189 (1982-03-01), Briese
patent: 4773799 (1988-09-01), Guironnet
patent: 4833930 (1989-05-01), Okamoto et al.
patent: 5228177 (1993-07-01), Herzog et al.
patent: 5678466 (1997-10-01), Wahl
patent: 3344944 (1991-08-01), None
patent: 43 09 134 (1994-09-01), None
patent: 298 06 237 (1998-07-01), None
patent: 44 13 090 (1999-08-01), None
patent: 198 05 394 (1999-08-01), None
patent: 199 12 942 (1999-10-01), None
patent: 299 23 909 (2001-08-01), None
patent: 101 60 219 (2003-06-01), None
patent: 102 51 922 (2003-06-01), None
patent: 102 20 054 (2003-11-01), None
patent: 0 470 961 (1992-02-01), None
patent: WO 91/14166 (1991-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sample machining device and sample analysis device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sample machining device and sample analysis device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample machining device and sample analysis device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3853869

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.