Luminescent diode

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure

Reexamination Certificate

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C438S046000

Reexamination Certificate

active

10332259

ABSTRACT:
A light-emitting diode based on GaAlAs has a window layer (5) of reduced thickness and is doped continuously with Si or Sn. The net concentration of the doping is less than 1 ×1018cm−3. This provision lessens the degradation of the light-emitting diode (1).

REFERENCES:
patent: 4575742 (1986-03-01), Kohashi et al.
patent: 5153889 (1992-10-01), Sugawara et al.
patent: 5491350 (1996-02-01), Unno et al.
patent: 5534717 (1996-07-01), Murasato et al.
patent: 5665984 (1997-09-01), Hasegawa et al.
patent: 196 30 689 (1998-01-01), None
patent: 2315920 (1998-02-01), None
Azoulay, R., Dugrand, L., Ankri, D., Rao, E.V.K.; MOCVD n-type Doping of GaAs and GaAlAs using silicon and selenium and fabrication of double heterostructure bipolar transistor. Sep. 1, 1984, Journal of Crystal Growth, vol. 68, Issue 1, pp. 453-460.
E. Depraetere et al., “The Photoplastic effect in GaAs, a model for device degradation phenomena”, Philosophical Magazine A, vol. 61, No. 6, 1990, pp. 893-907.
E. Munoz-Merino, “DX Centers and III-V Device Performance”, Material Research Society Symposium Proceedings, vol. 184, (1990) pp. 49-60.
Y.L. Khait, “Kinetic many-body theory of short-lived large energy fluctuations of small numbers of particles in solids and its applications”, Physics Reports, vol. 99 (1983), Nos. 4-5, pp. 237-340.
K. Maeda et al., “Recombination enhanced mobility of dislocations in III-V compounds”, Journal de Physique, Paris, vol. 44 (1983), pp. C4-375 to C4-385.
D.V. Lang et al., “A study of deep levels in GaAs by capacitance spectroscopy”, Journal of Electronic Materials, vol. 4, No. 5, 1975, pp. 1053-1066.
J. Zhou, et al., “Degradation Mechanism in GaAs LED”, Material Research Society Symposium Proceedings, vol. 184, (1990) pp. 145-150.
A.R. Peaker, “Defect energy levels in LPE GaAs”, Properties of Gallium Arsenide, INSPEC 1990, 2nd Edition, pp. 323-326.
O. Ueda, “Device-degradation III-V semiconductor lasers and LEDs-influence of defects on the degradation”, Material Research Society Symposium Proceedings, vol. 184 (1990), pp. 125-134.
A.S. Jordan et al., “The interplay of thermo-mechanical properties in the growth and processing of III-V materials”, Material Research Society Symposium Proceedings, vol. 226 (1991), pp. 117-127.
J. Salzman et al., “Material evolution and gradual degradation in semiconductor lasers and light emitting diodes”, Electronics Letters, vol. 25 (1989), No. 3, pp. 244-246.
H.S. Hajghassem et al., “Effects of Neutron Irradiation and Post-Irradiation Annealing on the Radiant Output Power of Infrared Light Emitting Diodes”, Material Research Symposium Proceedings, vol. 184 (1990), pp. 151-156.
Mitsuo Fukuda, “Reliability and Degradation of Semiconductor Lasers and LEDs”, Artech House, 1991.

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