Testing method and testing apparatus for liquid crystal panel

Details Testing method and testing apparatus for liquid crystal panel Testing method and testing apparatus for liquid crystal panel

2007-12-11

2007-12-11

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C356S432000

Reexamination Certificate

active

11190029

ABSTRACT:
The present invention provides a technique enabling the amount of time required to evaluate the light fastness of a liquid crystal panel to be shortened. A method of testing the light fastness of a liquid crystal panel comprising a pair of substrates and a liquid crystal layer interposed between the substrates comprises the steps of: irradiating a test subject area of the liquid crystal panel with a laser beam, with at least one of the wavelength, the irradiation energy, and the irradiation duration of the laser beam set as a variable parameter; irradiating the liquid crystal panel with an observation beam and detecting the condition of the observation beam after passing through the liquid crystal panel; and evaluating the light fastness of the liquid crystal panel on the basis of a difference in the condition of the observation beam corresponding to the setting of the variable parameter of the laser beam.

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Communication from Japanese Patent Office regarding corresponding application, 2006.

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